Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness

Yoshinori Dobashi, Takashi Ijiri, Hideki Todo, Kei Iwasaki, Makoto Okabe, Satoshi Nishimura

研究成果: Conference contribution

1 引用 (Scopus)

抜粋

Realistic image synthesis is an important research goal in computer graphics. One important factor to achieve this goal is a bidirectional reflectance distribution function (BRDF) that mainly governs an appearance of an object. Many BRDF models have therefore been developed. A physically-based BRDF based on microfacet theory [Cook and Torrance 1982] is widely used in many applications since it can produce highly realistic images. The microfacetbased BRDF consists of three terms; a Fresnel, a normal distribution, and a geometric functions. There are many analytical and approximate models for each of these terms.

元の言語English
ホスト出版物のタイトルSIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters
出版者Association for Computing Machinery, Inc
ISBN(電子版)9781450343718
DOI
出版物ステータスPublished - 2016 7 24
イベントACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016 - Anaheim, United States
継続期間: 2016 7 242016 7 28

出版物シリーズ

名前SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters

Other

OtherACM International Conference on Computer Graphics and Interactive Techniques, SIGGRAPH 2016
United States
Anaheim
期間16/7/2416/7/28

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Human-Computer Interaction
  • Software

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  • これを引用

    Dobashi, Y., Ijiri, T., Todo, H., Iwasaki, K., Okabe, M., & Nishimura, S. (2016). Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. : SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters [a28] (SIGGRAPH 2016 - ACM SIGGRAPH 2016 Posters). Association for Computing Machinery, Inc. https://doi.org/10.1145/2945078.2945106