Microstructure and Fatigue Damage of Eutectic Bi-Sn Alloy at High Temperature

T. Sato, Y. K, a a, Y. Kariya

研究成果: Article

元の言語English
ジャーナルProc. Of International Conference on Electronics Materials and Packaging
EMAP2011
出版物ステータスPublished - 2011 12 1

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