Microstructure and Fatigue Damage of Eutectic Bi-Sn Alloy at High Temperature

T. Sato, Y. K, a a, Y. Kariya

研究成果: Article › 査読

本文言語	English
ジャーナル	Proc. Of International Conference on Electronics Materials and Packaging
巻	EMAP2011
出版ステータス	Published - 2011 12月 1

引用スタイル

@article{634b121ad7a74495821c9c8a251fb42d,

title = "Microstructure and Fatigue Damage of Eutectic Bi-Sn Alloy at High Temperature",

author = "T. Sato and Y. K and a a and Y. Kariya",

year = "2011",

month = dec,

day = "1",

language = "English",

volume = "EMAP2011",

journal = "Proc. Of International Conference on Electronics Materials and Packaging",

}