Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction

Anjela Dimitrova Koblischka-Veneva, Michael Rudolf Koblischka, S. Murphy, S. K. Arora, F. Mücklich, U. Hartmann, I. V. Shvets

研究成果: Article

3 引用 (Scopus)

抄録

The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100-400 nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1 min, 250 °C) is characterized by the presence of tiny (diameter of 100-200 nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm -thick film with (001) orientation, even close to the interface MgO-magnetite.

元の言語English
記事番号07E505
ジャーナルJournal of Applied Physics
巻103
発行部数7
DOI
出版物ステータスPublished - 2008 4 24
外部発表Yes

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magnetite
thin films
diffraction
electrons
thick films
film thickness
spatial resolution
annealing
air
cross sections
defects

ASJC Scopus subject areas

  • Physics and Astronomy(all)

これを引用

Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction. / Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf; Murphy, S.; Arora, S. K.; Mücklich, F.; Hartmann, U.; Shvets, I. V.

：: Journal of Applied Physics, 巻 103, 番号 7, 07E505, 24.04.2008.

研究成果: Article

Koblischka-Veneva, AD, Koblischka, MR, Murphy, S, Arora, SK, Mücklich, F, Hartmann, U & Shvets, IV 2008, 'Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction', Journal of Applied Physics, 巻. 103, 番号 7, 07E505. https://doi.org/10.1063/1.2837283
Koblischka-Veneva AD, Koblischka MR, Murphy S, Arora SK, Mücklich F, Hartmann U その他. Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction. Journal of Applied Physics. 2008 4 24;103(7). 07E505. https://doi.org/10.1063/1.2837283
Koblischka-Veneva, Anjela Dimitrova ; Koblischka, Michael Rudolf ; Murphy, S. ; Arora, S. K. ; Mücklich, F. ; Hartmann, U. ; Shvets, I. V. / Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction. ：: Journal of Applied Physics. 2008 ; 巻 103, 番号 7.
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AU - Koblischka-Veneva, Anjela Dimitrova

AU - Koblischka, Michael Rudolf

AU - Murphy, S.

AU - Arora, S. K.

AU - Mücklich, F.

AU - Hartmann, U.

AU - Shvets, I. V.

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AB - The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100-400 nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1 min, 250 °C) is characterized by the presence of tiny (diameter of 100-200 nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm -thick film with (001) orientation, even close to the interface MgO-magnetite.

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