Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction

A. Koblischka-Veneva, M. R. Koblischka, S. Murphy, S. K. Arora, F. Mücklich, U. Hartmann, I. V. Shvets

研究成果: Article査読

3 被引用数 (Scopus)

抄録

The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100-400 nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1 min, 250 °C) is characterized by the presence of tiny (diameter of 100-200 nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm -thick film with (001) orientation, even close to the interface MgO-magnetite.

本文言語English
論文番号07E505
ジャーナルJournal of Applied Physics
103
7
DOI
出版ステータスPublished - 2008
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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