抄録
A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.
| 元の言語 | English |
|---|---|
| ページ数 | 1 |
| 出版物ステータス | Published - 1997 1 1 |
| 外部発表 | Yes |
| イベント | Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim - Chiba, Jpn 継続期間: 1997 7 14 → 1997 7 18 |
Other
| Other | Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim |
|---|---|
| 市 | Chiba, Jpn |
| 期間 | 97/7/14 → 97/7/18 |
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ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering
これを引用
Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback. / Umamaheswari, Rajagopalan; Takehara, S.; Mononobe, S.; Lee, G. H.; Yoshimoto, M.; Koinuna, H.; Ohtsu, M.
1997. 論文発表場所 Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn, .研究成果: Paper
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TY - CONF
T1 - Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback
AU - Umamaheswari, Rajagopalan
AU - Takehara, S.
AU - Mononobe, S.
AU - Lee, G. H.
AU - Yoshimoto, M.
AU - Koinuna, H.
AU - Ohtsu, M.
PY - 1997/1/1
Y1 - 1997/1/1
N2 - A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.
AB - A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.
UR - http://www.scopus.com/inward/record.url?scp=0030714412&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0030714412&partnerID=8YFLogxK
M3 - Paper
AN - SCOPUS:0030714412
ER -