Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback

R. Uma Maheswari; S. Takehara; S. Mononobe; G. H. Lee; M. Yoshimoto; H. Koinuna; M. Ohtsu

Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback

R. Uma Maheswari, S. Takehara, S. Mononobe, G. H. Lee, M. Yoshimoto, H. Koinuna, M. Ohtsu

研究成果: Paper › 査読

抄録

A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.

本文言語	English
ページ	306
ページ数	1
出版ステータス	Published - 1997
外部発表	はい
イベント	Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim - Chiba, Jpn 継続期間: 1997 7月 14 → 1997 7月 18

Other

Other	Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim
City	Chiba, Jpn
Period	97/7/14 → 97/7/18

ASJC Scopus subject areas

電子材料、光学材料、および磁性材料
原子分子物理学および光学
凝縮系物理学
電子工学および電気工学

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引用スタイル

Maheswari, R. U., Takehara, S., Mononobe, S., Lee, G. H., Yoshimoto, M., Koinuna, H., & Ohtsu, M. (1997). Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback. 306. Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn.

Maheswari, RU, Takehara, S, Mononobe, S, Lee, GH, Yoshimoto, M, Koinuna, H & Ohtsu, M 1997, 'Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback', Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn, 97/7/14 - 97/7/18 pp. 306.

@conference{48f60f52a2104f0a8025750d3965847a,

title = "Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback",

abstract = "A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.",

author = "Maheswari, {R. Uma} and S. Takehara and S. Mononobe and Lee, {G. H.} and M. Yoshimoto and H. Koinuna and M. Ohtsu",

note = "Copyright: Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.; Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim ; Conference date: 14-07-1997 Through 18-07-1997",

year = "1997",

language = "English",

pages = "306",

}

TY - CONF

T1 - Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback

AU - Maheswari, R. Uma

AU - Takehara, S.

AU - Mononobe, S.

AU - Lee, G. H.

AU - Yoshimoto, M.

AU - Koinuna, H.

AU - Ohtsu, M.

PY - 1997

Y1 - 1997

N2 - A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.

AB - A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.

UR - http://www.scopus.com/inward/record.url?scp=0030714412&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030714412&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0030714412

SP - 306

T2 - Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim

Y2 - 14 July 1997 through 18 July 1997

ER -