Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback

R. Uma Maheswari; S. Takehara; S. Mononobe; G. H. Lee; M. Yoshimoto; H. Koinuna; M. Ohtsu

Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback

R. Uma Maheswari, S. Takehara, S. Mononobe, G. H. Lee, M. Yoshimoto, H. Koinuna, M. Ohtsu

研究成果 › 査読

抄録

A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.

本文言語	English
ページ	306
ページ数	1
出版ステータス	Published - 1997
外部発表	はい
イベント	Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim - Chiba, Jpn 継続期間: 1997 7 14 → 1997 7 18

Other

Other	Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim
City	Chiba, Jpn
Period	97/7/14 → 97/7/18

ASJC Scopus subject areas

電子材料、光学材料、および磁性材料
原子分子物理学および光学
凝縮系物理学
電子工学および電気工学

他のファイルとリンク

フィンガープリント

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引用スタイル

Maheswari, R. U., Takehara, S., Mononobe, S., Lee, G. H., Yoshimoto, M., Koinuna, H., & Ohtsu, M. (1997). Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback. 306. Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn.

Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback. / Maheswari, R. Uma; Takehara, S.; Mononobe, S.; Lee, G. H.; Yoshimoto, M.; Koinuna, H.; Ohtsu, M.

1997. 306 Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn.

研究成果 › 査読

Maheswari, RU, Takehara, S, Mononobe, S, Lee, GH, Yoshimoto, M, Koinuna, H & Ohtsu, M 1997, 'Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback', Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn, 97/7/14 - 97/7/18 pp. 306.

Maheswari, R. Uma ; Takehara, S. ; Mononobe, S. ; Lee, G. H. ; Yoshimoto, M. ; Koinuna, H. ; Ohtsu, M. / Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback. Paper presented at Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim, Chiba, Jpn.1 p.

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abstract = "A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.",

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