A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.
|出版ステータス||Published - 1997|
|イベント||Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim - Chiba, Jpn|
継続期間: 1997 7月 14 → 1997 7月 18
|Other||Proceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim|
|Period||97/7/14 → 97/7/18|
ASJC Scopus subject areas