Near field optical imaging of an atomic sapphire step and nanometric lithium niobate crystals under the absence of shear force feedback

R. Uma Maheswari, S. Takehara, S. Mononobe, G. H. Lee, M. Yoshimoto, H. Koinuna, M. Ohtsu

研究成果: Paper査読

抄録

A collection mode near-field microscopy (NOM) was utilized in the examination of sapphire and nanometric lithium niobate crystals. The sample was illuminated under total internal reflection with the evanescent field generated on the sample surface scattered by a nanometric probe. A sapphire staircase consisting of monoatomic layers grown epitaxially has been used. The height of the step was measured with an atomic force microscope. Images were obtained under constant intensity mode by keeping the evanescent intensity constant; while constant height mode was obtained with a constant probe height.

本文言語English
ページ306
ページ数1
出版ステータスPublished - 1997
外部発表はい
イベントProceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim - Chiba, Jpn
継続期間: 1997 7 141997 7 18

Other

OtherProceedings of the 1997 Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim
CityChiba, Jpn
Period97/7/1497/7/18

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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