Nondestructive elemental depth-profiling analysis by muonic X-ray measurement

Kazuhiko Ninomiya, Michael K. Kubo, Takashi Nagatomo, Wataru Higemoto, Takashi U. Ito, Naritoshi Kawamura, Patrick Strasser, Koichiro Shimomura, Yasuhiro Miyake, Takao Suzuki, Yoshio Kobayashi, Shinichi Sakamoto, Atsushi Shinohara, Tsutomu Saito

研究成果: Article

12 引用 (Scopus)

抜粋

Elemental analysis of materials is fundamentally important to science and technology. Many elemental analysis methods have been developed, but three-dimensional nondestructive elemental analysis of bulk materials has remained elusive. Recently, our project team, dreamX (damageless and regioselective elemental analysis with muonic X-rays), developed a nondestructive depth-profiling elemental analysis method after a decade of research. This new method utilizes a new type of probe; a negative muon particle and high-energy muonic X-rays emitted after the muon stops in a material. We performed elemental depth profiling on an old Japanese gold coin (Tempo-Koban) using a low-momentum negative muon beam and successfully determined that the Au concentration in the coin gradually decreased with depth over a micrometer length scale. We believe that this method will be a promising tool for the elemental analysis of valuable samples, such as archeological artifacts.

元の言語English
ページ(範囲)4597-4600
ページ数4
ジャーナルAnalytical Chemistry
87
発行部数9
DOI
出版物ステータスPublished - 2015 5 5

ASJC Scopus subject areas

  • Analytical Chemistry

フィンガープリント Nondestructive elemental depth-profiling analysis by muonic X-ray measurement' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Ninomiya, K., Kubo, M. K., Nagatomo, T., Higemoto, W., Ito, T. U., Kawamura, N., Strasser, P., Shimomura, K., Miyake, Y., Suzuki, T., Kobayashi, Y., Sakamoto, S., Shinohara, A., & Saito, T. (2015). Nondestructive elemental depth-profiling analysis by muonic X-ray measurement. Analytical Chemistry, 87(9), 4597-4600. https://doi.org/10.1021/acs.analchem.5b01169