Numerical analysis of backside-electrode effects and field-plate effects on buffer-related current collapse in AlGaN/GaN HEMTs

K. Horio, H. Onodera

研究成果: Article

元の言語English
ページ(範囲)19-20
ジャーナルProceedings of 34th Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2010), Darmstadt, Germany
出版物ステータスPublished - 2010 5 17

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