Numerical analysis of backside-electrode effects and field-plate effects on buffer-related current collapse in AlGaN/GaN HEMTs

K. Horio, H. Onodera

研究成果: Article査読

本文言語English
ページ(範囲)19-20
ジャーナルProceedings of 34th Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2010), Darmstadt, Germany
出版ステータスPublished - 2010 5 17

引用スタイル