本文言語 | English |
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ページ(範囲) | 19-20 |
ジャーナル | Proceedings of 34th Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2010), Darmstadt, Germany |
出版ステータス | Published - 2010 5月 17 |
Numerical analysis of backside-electrode effects and field-plate effects on buffer-related current collapse in AlGaN/GaN HEMTs
K. Horio, H. Onodera
研究成果: Article › 査読