On-board snubber circuit for damping of anti-resonance peak in total PDN

Toma Yamaguchi, Kanae Kurita, Toshio Sudo

研究成果: Conference contribution

2 引用 (Scopus)

抄録

Power supply noise is a serious issue for advanced CMOS LSIs and systems, since the performance of LSI chip is becoming more sensitive to power supply fluctuation under the lower power supply voltage. Because power supply noises are strongly related to the anti-resonance peak frequency in the total power distribution network (PDN), suppressing the anti-resonance peak is one of the most important design concerns. In this paper, the on-board snubber circuits (RC series circuits) has been studied to suppress the anti-resonance peak. The optimal circuit parameters of the on-board snubber circuits such as capacitance (Csnb) and resistance (Rdmp) were derived for quad flat package (QFP) and ball grid array (BGA) to effectively suppress the anti-resonance peak of the total PDN impedance. As a result, the settling time of power supply noises were greatly decreased. Furthermore, clock frequency dependency of power supply noise was also significantly decreased.

元の言語English
ホスト出版物のタイトルIEEE CPMT Symposium Japan 2014 - The Leading International Components, Packaging, and Manufacturing Technology Symposium: "Packaging for Future Optoelectronics, RF/High-Speed Electronics and Bioelectronics", ICSJ 2014
出版者Institute of Electrical and Electronics Engineers Inc.
ページ91-94
ページ数4
ISBN(印刷物)9781479961955
DOI
出版物ステータスPublished - 2015 1 13
イベント2014 4th IEEE CPMT Symposium Japan, ICSJ 2014 - Kyoto
継続期間: 2014 11 42014 11 6

Other

Other2014 4th IEEE CPMT Symposium Japan, ICSJ 2014
Kyoto
期間14/11/414/11/6

Fingerprint

Electric power distribution
Damping
Networks (circuits)
Ball grid arrays
Clocks
Capacitance
Electric potential

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

これを引用

Yamaguchi, T., Kurita, K., & Sudo, T. (2015). On-board snubber circuit for damping of anti-resonance peak in total PDN. : IEEE CPMT Symposium Japan 2014 - The Leading International Components, Packaging, and Manufacturing Technology Symposium: "Packaging for Future Optoelectronics, RF/High-Speed Electronics and Bioelectronics", ICSJ 2014 (pp. 91-94). [7009617] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSJ.2014.7009617

On-board snubber circuit for damping of anti-resonance peak in total PDN. / Yamaguchi, Toma; Kurita, Kanae; Sudo, Toshio.

IEEE CPMT Symposium Japan 2014 - The Leading International Components, Packaging, and Manufacturing Technology Symposium: "Packaging for Future Optoelectronics, RF/High-Speed Electronics and Bioelectronics", ICSJ 2014. Institute of Electrical and Electronics Engineers Inc., 2015. p. 91-94 7009617.

研究成果: Conference contribution

Yamaguchi, T, Kurita, K & Sudo, T 2015, On-board snubber circuit for damping of anti-resonance peak in total PDN. : IEEE CPMT Symposium Japan 2014 - The Leading International Components, Packaging, and Manufacturing Technology Symposium: "Packaging for Future Optoelectronics, RF/High-Speed Electronics and Bioelectronics", ICSJ 2014., 7009617, Institute of Electrical and Electronics Engineers Inc., pp. 91-94, 2014 4th IEEE CPMT Symposium Japan, ICSJ 2014, Kyoto, 14/11/4. https://doi.org/10.1109/ICSJ.2014.7009617
Yamaguchi T, Kurita K, Sudo T. On-board snubber circuit for damping of anti-resonance peak in total PDN. : IEEE CPMT Symposium Japan 2014 - The Leading International Components, Packaging, and Manufacturing Technology Symposium: "Packaging for Future Optoelectronics, RF/High-Speed Electronics and Bioelectronics", ICSJ 2014. Institute of Electrical and Electronics Engineers Inc. 2015. p. 91-94. 7009617 https://doi.org/10.1109/ICSJ.2014.7009617
Yamaguchi, Toma ; Kurita, Kanae ; Sudo, Toshio. / On-board snubber circuit for damping of anti-resonance peak in total PDN. IEEE CPMT Symposium Japan 2014 - The Leading International Components, Packaging, and Manufacturing Technology Symposium: "Packaging for Future Optoelectronics, RF/High-Speed Electronics and Bioelectronics", ICSJ 2014. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 91-94
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