元の言語 | English |
---|---|
ホスト出版物のタイトル | Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference |
ページ | 154-155 |
ページ数 | 2 |
巻 | 2005 |
出版物ステータス | Published - 2005 |
外部発表 | Yes |
イベント | 2005 International Microprocesses and Nanotechnology Conference - Tokyo 継続期間: 2005 10 25 → 2005 10 28 |
Other
Other | 2005 International Microprocesses and Nanotechnology Conference |
---|---|
市 | Tokyo |
期間 | 05/10/25 → 05/10/28 |
Fingerprint
ASJC Scopus subject areas
- Engineering(all)
これを引用
On proximity effect in electron beam induced deposition. / Mitsuishi, K.; Shimojo, Masayuki; Takeguchi, M.; Tanaka, M.; Furuya, K.
Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 巻 2005 2005. p. 154-155 1595260.研究成果: Conference contribution
}
TY - GEN
T1 - On proximity effect in electron beam induced deposition
AU - Mitsuishi, K.
AU - Shimojo, Masayuki
AU - Takeguchi, M.
AU - Tanaka, M.
AU - Furuya, K.
PY - 2005
Y1 - 2005
UR - http://www.scopus.com/inward/record.url?scp=33847184619&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33847184619&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:33847184619
SN - 4990247221
SN - 9784990247225
VL - 2005
SP - 154
EP - 155
BT - Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference
ER -