Optical properties of AlxGa1-xN/GaN heterostructures on sapphire by spectroscopic ellipsometry

G. Yu, H. Ishikawa, M. Umeno, T. Egawa, J. Watanabe, T. Jimbo, T. Soga

研究成果: Article

48 引用 (Scopus)
元の言語English
ページ(範囲)2202-2204
ジャーナルAppl. Phys. Lett.
72
出版物ステータスPublished - 1998 5 1

これを引用

Yu, G., Ishikawa, H., Umeno, M., Egawa, T., Watanabe, J., Jimbo, T., & Soga, T. (1998). Optical properties of AlxGa1-xN/GaN heterostructures on sapphire by spectroscopic ellipsometry. Appl. Phys. Lett., 72, 2202-2204.

Optical properties of AlxGa1-xN/GaN heterostructures on sapphire by spectroscopic ellipsometry. / Yu, G.; Ishikawa, H.; Umeno, M.; Egawa, T.; Watanabe, J.; Jimbo, T.; Soga, T.

:: Appl. Phys. Lett., 巻 72, 01.05.1998, p. 2202-2204.

研究成果: Article

Yu, G, Ishikawa, H, Umeno, M, Egawa, T, Watanabe, J, Jimbo, T & Soga, T 1998, 'Optical properties of AlxGa1-xN/GaN heterostructures on sapphire by spectroscopic ellipsometry', Appl. Phys. Lett., 巻. 72, pp. 2202-2204.
Yu, G. ; Ishikawa, H. ; Umeno, M. ; Egawa, T. ; Watanabe, J. ; Jimbo, T. ; Soga, T. / Optical properties of AlxGa1-xN/GaN heterostructures on sapphire by spectroscopic ellipsometry. :: Appl. Phys. Lett. 1998 ; 巻 72. pp. 2202-2204.
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AU - Watanabe, J.

AU - Jimbo, T.

AU - Soga, T.

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