Optical properties of wurtzite structure GaN on sapphire around fundamental absorption edge (0.78-4.77 eV) by spectroscopic ellipsometry and the optical transmission method

G. Yu, G. Wang, H. Ishikawa, M. Umeno, T. Soga, T. Egawa, J. Watanabe, T. Jimbo

研究成果: Article査読

253 被引用数 (Scopus)

抄録

Spectroscopic ellipsometry (SE) together with the optical transmission method is successfully used to determine the refractive index n and absorption coefficient α of undoped gallium nitride film over the spectral range of 0.78-4.77 eV of photon energy. The SE measurement is carried out at angle of incidence of 60° over the 1.5-4.77 eV energy range and optical transmission measurement over the 0.78-3.55 eV energy range. The refractive index n and absorption coefficient α obtained by both methods show unique results in the overlap wavelength region. Refractive index n is found to follow the Sellmeir dispersion relationship n2(λ)=2.272+304.72/(λ 2-294.02) below the fundamental band edge. A free excitonic structure at the band is clearly observed at room temperature, with the transmission energy of free exciton at 3.44 eV, which is in reasonable agreement with the reported results.

本文言語English
ページ(範囲)3209-3211
ページ数3
ジャーナルApplied Physics Letters
70
24
DOI
出版ステータスPublished - 1997 6 16
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(その他)

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