Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials

P. D. Nellist, P. D.Nellist;P.Wang;A.I. Kirkl, ;A. J.DAlfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.Take Shimojo

研究成果: Article査読

本文言語English
ジャーナルDefault journal
出版ステータスPublished - 2012 12 1

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