Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials

P. D. Nellist; P. D.Nellist;P.Wang;A.I. Kirkl; ;A. J.DAlfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.Take Shimojo

Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials

P. D. Nellist, P. D.Nellist;P.Wang;A.I. Kirkl, ;A. J.DAlfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.Take Shimojo

機能制御システム専攻

研究成果 › 査読

本文言語	English
ジャーナル	Default journal
出版ステータス	Published - 2012 12月 1

引用スタイル

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AU - Nellist, P. D.

AU - Kirkl, P. D.Nellist;P.Wang;A.I.

AU - Shimojo, ;A. J.DAlfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.Take

PY - 2012/12/1

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