Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions

M.F. Frechette, C.Hudon C.Hudon, M. Germain, R.Y.Larocque R.Y.Larocque, Satoshi Matsumoto, Tokihiro Umemura

研究成果: Article

3 引用 (Scopus)
元の言語English
ページ(範囲)639-644
ジャーナルIEEE Conf. on Electr. Insul. and Diel. Phen.
出版物ステータスPublished - 2000 10 15

これを引用

Frechette, M. F., C.Hudon, C. H., Germain, M., R.Y.Larocque, R. Y. L., Matsumoto, S., & Umemura, T. (2000). Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions. IEEE Conf. on Electr. Insul. and Diel. Phen., 639-644.