Physics-based simulation of buffer-trapping effects on slow current transients and current collapse in GaN field effect transistors

Physics & Astronomy

• buffers 100%
• causes 12%
• curves 21%
• cut-off 16%
• electric potential 21%
• electron emission 19%
• electrons 8%
• field effect transistors 93%
• high voltages 17%
• metals 10%
• physics 74%
• simulation 45%
• time lag 50%
• trapping 91%