抄録
The nanometer-scale pinning defects observed in melt-processed (Nd0.33Eu0.38Gd0.28)Ba2Cu3 Oy (NEG-123) materials were discussed. The analysis with scanning tunneling microscope (STM) and dynamic force microscope (DFM) revealed a nanoscale laminar structure with a period comparable to the coherence length that is most probably responsible for the pinning enhancement. The observations demonstrated a secondary peak as high as 70 kA/cm2 at 4.5 T and decreased to 49 and 22 kA/cm2 at 7 and 10 T respectively.
本文言語 | English |
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ページ(範囲) | 943-945 |
ページ数 | 3 |
ジャーナル | Applied Physics Letters |
巻 | 82 |
号 | 6 |
DOI | |
出版ステータス | Published - 2003 2月 10 |
外部発表 | はい |
ASJC Scopus subject areas
- 物理学および天文学(その他)