Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition

M. Takeguchi, Masayuki Shimojo, M. Tanaka, M. Mitsuishi, R. Che, W. Zhang, K. Furuya

研究成果: Conference contribution

元の言語English
ホスト出版物のタイトルDigest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference
ページ232-233
ページ数2
2005
出版物ステータスPublished - 2005
外部発表Yes
イベント2005 International Microprocesses and Nanotechnology Conference - Tokyo
継続期間: 2005 10 252005 10 28

Other

Other2005 International Microprocesses and Nanotechnology Conference
Tokyo
期間05/10/2505/10/28

Fingerprint

Nanorods
Electron beams

ASJC Scopus subject areas

  • Engineering(all)

これを引用

Takeguchi, M., Shimojo, M., Tanaka, M., Mitsuishi, M., Che, R., Zhang, W., & Furuya, K. (2005). Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. : Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference (巻 2005, pp. 232-233). [1595299]

Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. / Takeguchi, M.; Shimojo, Masayuki; Tanaka, M.; Mitsuishi, M.; Che, R.; Zhang, W.; Furuya, K.

Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 巻 2005 2005. p. 232-233 1595299.

研究成果: Conference contribution

Takeguchi, M, Shimojo, M, Tanaka, M, Mitsuishi, M, Che, R, Zhang, W & Furuya, K 2005, Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. : Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 巻. 2005, 1595299, pp. 232-233, 2005 International Microprocesses and Nanotechnology Conference, Tokyo, 05/10/25.
Takeguchi M, Shimojo M, Tanaka M, Mitsuishi M, Che R, Zhang W その他. Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. : Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 巻 2005. 2005. p. 232-233. 1595299
Takeguchi, M. ; Shimojo, Masayuki ; Tanaka, M. ; Mitsuishi, M. ; Che, R. ; Zhang, W. ; Furuya, K. / Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 巻 2005 2005. pp. 232-233
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