Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition

M. Takeguchi, M. Shimojo, M. Tanaka, M. Mitsuishi, R. Che, W. Zhang, K. Furuya

研究成果: Conference contribution

元の言語English
ホスト出版物のタイトルDigest of Papers - Microprocesses and Nanotechnology 2005
ホスト出版物のサブタイトル2005 International Microprocesses and Nanotechnology Conference
ページ232-233
ページ数2
出版物ステータスPublished - 2005 12 1
外部発表Yes
イベント2005 International Microprocesses and Nanotechnology Conference - Tokyo, Japan
継続期間: 2005 10 252005 10 28

出版物シリーズ

名前Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference
2005

Conference

Conference2005 International Microprocesses and Nanotechnology Conference
Japan
Tokyo
期間05/10/2505/10/28

ASJC Scopus subject areas

  • Engineering(all)

これを引用

Takeguchi, M., Shimojo, M., Tanaka, M., Mitsuishi, M., Che, R., Zhang, W., & Furuya, K. (2005). Potential distribution in resistivity measurement for nanorods formed by electron beam induced deposition. : Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference (pp. 232-233). [1595299] (Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference; 巻数 2005).