Prediction of thermal fatigue life for encapsulated flip chip interconnection

Kazuhide Doi, Naohiko Hirano, Takashi Okada, Yoichi Hiruta, Toshio Sudo, Minoru Mukai

研究成果: Article査読

34 被引用数 (Scopus)

抄録

The thermal fatigue life of eutectic (Pb63Sn) solder bumps for encapsulated flip chip interconnections was investigated by a Temperature Cycling Test (TCT) using three types of substrates (FR-4, Al2O3, and AlN) and three kinds of encapsulants having different Young's modulus and CTE (Coefficient of Thermal Expansion, α). The bump height was changed from 20 to 80 μm in this test. The strain ranges in the solder bumps during TCT were characterized by FEM (Finite Element Method) simulation using two types of models. The whole flip chip structure model was used to analyze the deformation of the solder bumps and the unit bump model was used to analyze the plastic strain range distribution in the solder bumps. The relationship between Nf50 and the average strain range of the eutectic solder bumps could be represented by an equation based on the Coffin-Manson relation. The thermal fatigue life of the eutectic solder bumps for encapsulated flip chip interconnections was found to be proportional to the bump height and the Young's modulus of the encapsulant.

本文言語English
ページ(範囲)231-236
ページ数6
ジャーナルInternational Journal of Microcircuits and Electronic Packaging
19
3
出版ステータスPublished - 1996 9 1

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 安全性、リスク、信頼性、品質管理
  • 電子工学および電気工学

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