Reconstruction method for phase-shifting electron holography fitted with fresnel diffraction affected fringes

Dan Lei, Kazutaka Mitsuishi, Masayuki Shimojo, Masaki Takeguchi

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

Phase-shifting electron holography is a transmission electron microscope technique that a number of holograms with different initial phases are acquired by changing the angle of the incident electron beam, and the intensity variation at a certain point on the holograms is fitted by sinusoidal curve to retrieve the object wave passing through a specimen. In reality, however, Fresnel fringes caused by the electrostatic biprism modulates the electron wave, limits the fitting accuracy and results in phase errors in phase reconstruction. In this study, we suggest a modified phase reconstruction method for phase-shifting electron holography. The intensity variations at a certain point on each hologram are fitted not by sinusoidal curve, but by Fresnel diffraction affected curve to retrieve the object wave. This would provide better fitting accuracy, and has a potential to improve the precision of phase-shifting electron holography. Simulations demonstrated the improvements of this method comparing with conventional phase-shifting holography method.

本文言語English
ホスト出版物のタイトルApplied Materials and Technologies
編集者Xiaopeng Xiong, Ran Zhang
出版社Trans Tech Publications Ltd
ページ215-221
ページ数7
ISBN(印刷版)9783038355960
DOI
出版ステータスPublished - 2015
イベント9th International Forum on Advanced Material Science and Technology, IFAMST9 2014 - Xiamen, China
継続期間: 2014 11 302014 12 3

出版物シリーズ

名前Materials Science Forum
833
ISSN(印刷版)0255-5476
ISSN(電子版)1662-9752

Other

Other9th International Forum on Advanced Material Science and Technology, IFAMST9 2014
国/地域China
CityXiamen
Period14/11/3014/12/3

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 材料力学
  • 機械工学

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