Reconstruction method for phase-shifting electron holography fitted with fresnel diffraction affected fringes

Dan Lei, Kazutaka Mitsuishi, Masayuki Shimojo, Masaki Takeguchi

研究成果: Conference contribution

抜粋

Phase-shifting electron holography is a transmission electron microscope technique that a number of holograms with different initial phases are acquired by changing the angle of the incident electron beam, and the intensity variation at a certain point on the holograms is fitted by sinusoidal curve to retrieve the object wave passing through a specimen. In reality, however, Fresnel fringes caused by the electrostatic biprism modulates the electron wave, limits the fitting accuracy and results in phase errors in phase reconstruction. In this study, we suggest a modified phase reconstruction method for phase-shifting electron holography. The intensity variations at a certain point on each hologram are fitted not by sinusoidal curve, but by Fresnel diffraction affected curve to retrieve the object wave. This would provide better fitting accuracy, and has a potential to improve the precision of phase-shifting electron holography. Simulations demonstrated the improvements of this method comparing with conventional phase-shifting holography method.

元の言語English
ホスト出版物のタイトルApplied Materials and Technologies
出版者Trans Tech Publications Ltd
ページ215-221
ページ数7
833
ISBN(印刷物)9783038355960
DOI
出版物ステータスPublished - 2015
イベント9th International Forum on Advanced Material Science and Technology, IFAMST9 2014 - Xiamen, China
継続期間: 2014 11 302014 12 3

出版物シリーズ

氏名Materials Science Forum
833
ISSN(印刷物)02555476

Other

Other9th International Forum on Advanced Material Science and Technology, IFAMST9 2014
China
Xiamen
期間14/11/3014/12/3

    フィンガープリント

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

これを引用

Lei, D., Mitsuishi, K., Shimojo, M., & Takeguchi, M. (2015). Reconstruction method for phase-shifting electron holography fitted with fresnel diffraction affected fringes. : Applied Materials and Technologies (巻 833, pp. 215-221). (Materials Science Forum; 巻 833). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/MSF.833.215