Reduction of buffer-related current collapse in field-plate AlGaN/GaN HEMTs

Atsushi Nakajima, Keiichi Itagaki, Kazushige Horio

研究成果: Article査読

2 被引用数 (Scopus)

抄録

Two-dimensional transient analyses of field-plate AlGaN/GaN HEMTs are performed in which a deep donor and a deep acceptor are considered in a semi-insulating buffer layer, and quasi-pulsed current-voltage curves are derived from them. It is studied how the existence of field plate affects buffer-related drain lag, gate lag and current collapse. It is shown that the drain lag is reduced by introducing a field plate, because electron injection into the buffer layer is weakened by it, and the trapping effects are reduced. It is also shown that the current collapse and gate lag are reduced in the field-plate structure. The dependence on SiN passivation layer thickness is also studied, suggesting that there is an optimum thickness of SiN layer to minimize the buffer-related current collapse and drain lag in AlGaN/GaN HEMTs.

本文言語English
ページ(範囲)S929-S932
ジャーナルPhysica Status Solidi (C) Current Topics in Solid State Physics
6
SUPPL. 2
DOI
出版ステータスPublished - 2009 7 1

ASJC Scopus subject areas

  • 凝縮系物理学

フィンガープリント

「Reduction of buffer-related current collapse in field-plate AlGaN/GaN HEMTs」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル