Resistivity measurements of nanorods formed by electron beam-induced deposition

Masayuki Shimojo, M. Takeguchi, R. Che, W. Zhang, M. Tanaka, K. Mitsuishi, K. Furuya

研究成果: Conference contribution

元の言語English
ホスト出版物のタイトルDigest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference
ページ158-159
ページ数2
2005
出版物ステータスPublished - 2005
外部発表Yes
イベント2005 International Microprocesses and Nanotechnology Conference - Tokyo
継続期間: 2005 10 252005 10 28

Other

Other2005 International Microprocesses and Nanotechnology Conference
Tokyo
期間05/10/2505/10/28

Fingerprint

Nanorods
Electron beams

ASJC Scopus subject areas

  • Engineering(all)

これを引用

Shimojo, M., Takeguchi, M., Che, R., Zhang, W., Tanaka, M., Mitsuishi, K., & Furuya, K. (2005). Resistivity measurements of nanorods formed by electron beam-induced deposition. : Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference (巻 2005, pp. 158-159). [1595262]

Resistivity measurements of nanorods formed by electron beam-induced deposition. / Shimojo, Masayuki; Takeguchi, M.; Che, R.; Zhang, W.; Tanaka, M.; Mitsuishi, K.; Furuya, K.

Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 巻 2005 2005. p. 158-159 1595262.

研究成果: Conference contribution

Shimojo, M, Takeguchi, M, Che, R, Zhang, W, Tanaka, M, Mitsuishi, K & Furuya, K 2005, Resistivity measurements of nanorods formed by electron beam-induced deposition. : Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 巻. 2005, 1595262, pp. 158-159, 2005 International Microprocesses and Nanotechnology Conference, Tokyo, 05/10/25.
Shimojo M, Takeguchi M, Che R, Zhang W, Tanaka M, Mitsuishi K その他. Resistivity measurements of nanorods formed by electron beam-induced deposition. : Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 巻 2005. 2005. p. 158-159. 1595262
Shimojo, Masayuki ; Takeguchi, M. ; Che, R. ; Zhang, W. ; Tanaka, M. ; Mitsuishi, K. ; Furuya, K. / Resistivity measurements of nanorods formed by electron beam-induced deposition. Digest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference. 巻 2005 2005. pp. 158-159
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AU - Furuya, K.

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