| 元の言語 | English |
|---|---|
| ジャーナル | Default journal |
| 出版物ステータス | Published - 1995 9 1 |
これを引用
Noda, K., Itou, M., Nishikata, A., & Tsuru, T. (1995). Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer. Default journal.
Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer.
K. Noda, M. Itou, A. Nishikata, T. Tsuru
研究成果: Article