Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi, X. Zhang, A. Hashimoto, K. Mitsuishi, Masayuki Shimojo, P. Wang, N. D. Peter, A. I. Kirkland

研究成果: Article

元の言語English
ページ(範囲)332-333
ページ数2
ジャーナルMicroscopy and Microanalysis
18
DOI
出版物ステータスPublished - 2012

ASJC Scopus subject areas

  • Instrumentation

これを引用

Takeguchi, M., Zhang, X., Hashimoto, A., Mitsuishi, K., Shimojo, M., Wang, P., Peter, N. D., & Kirkland, A. I. (2012). Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique. Microscopy and Microanalysis, 18, 332-333. https://doi.org/10.1017/S1431927612003510