Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi, X. Zhang, A. Hashimoto, K. Mitsuishi, Masayuki Shimojo, P. Wang, N. D. Peter, A. I. Kirkland

研究成果: Article

元の言語English
ページ(範囲)332-333
ページ数2
ジャーナルMicroscopy and Microanalysis
18
DOI
出版物ステータスPublished - 2012

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Confocal microscopy
Deconvolution
Electron microscopy
Scanning
scanning electron microscopy

ASJC Scopus subject areas

  • Instrumentation

これを引用

Takeguchi, M., Zhang, X., Hashimoto, A., Mitsuishi, K., Shimojo, M., Wang, P., ... Kirkland, A. I. (2012). Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique. Microscopy and Microanalysis, 18, 332-333. https://doi.org/10.1017/S1431927612003510

Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique. / Takeguchi, M.; Zhang, X.; Hashimoto, A.; Mitsuishi, K.; Shimojo, Masayuki; Wang, P.; Peter, N. D.; Kirkland, A. I.

:: Microscopy and Microanalysis, 巻 18, 2012, p. 332-333.

研究成果: Article

Takeguchi, M, Zhang, X, Hashimoto, A, Mitsuishi, K, Shimojo, M, Wang, P, Peter, ND & Kirkland, AI 2012, 'Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique', Microscopy and Microanalysis, 巻. 18, pp. 332-333. https://doi.org/10.1017/S1431927612003510
Takeguchi, M. ; Zhang, X. ; Hashimoto, A. ; Mitsuishi, K. ; Shimojo, Masayuki ; Wang, P. ; Peter, N. D. ; Kirkland, A. I. / Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique. :: Microscopy and Microanalysis. 2012 ; 巻 18. pp. 332-333.
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