Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

P. Wang; G. Behan; A. I. Kirkl; P. D. Nellist; E. C. Cosgriff; A. J. D'Alfonso; A. J. Morgan; L. J. Allen; A. Hashimoto; M. Takeguchi; K. Mitsuishi; M. Shimojo

Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

P. Wang, G. Behan, A. I. Kirkl, P. D. Nellist, E. C. Cosgriff, A. J. D'Alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo

機能制御システム専攻

研究成果: Article › 査読

19 被引用数 (Scopus)

本文言語	English
ジャーナル	Default journal
出版ステータス	Published - 2011 9月 1

引用スタイル

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title = "Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope",

author = "P. Wang and G. Behan and Kirkl, {A. I.} and Nellist, {P. D.} and Cosgriff, {E. C.} and D'Alfonso, {A. J.} and Morgan, {A. J.} and Allen, {L. J.} and A. Hashimoto and M. Takeguchi and K. Mitsuishi and M. Shimojo",

year = "2011",

month = sep,

day = "1",

language = "English",

journal = "Default journal",

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TY - JOUR

T1 - Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

AU - Wang, P.

AU - Behan, G.

AU - Kirkl, A. I.

AU - Nellist, P. D.

AU - Cosgriff, E. C.

AU - D'Alfonso, A. J.

AU - Morgan, A. J.

AU - Allen, L. J.

AU - Hashimoto, A.

AU - Takeguchi, M.

AU - Mitsuishi, K.

AU - Shimojo, M.

PY - 2011/9/1

Y1 - 2011/9/1

M3 - Article

JO - Default journal

JF - Default journal

ER -