TY - GEN
T1 - Second-Order N-path Notch Filter for Hum Noise Suppression
AU - Afifah, Khilda
AU - Arijal, Muhammad
AU - Retdian, Nicodimus
AU - Shima, Takeshi
N1 - Funding Information:
ACKNOWLEDGMENT This work is supported by VLSI Design and Education Center(VDEC), the University of Tokyo in collaboration with Synopsys, Inc and Cadence Design Systems, Inc. This work is also partly funded by JSPS KAKENHI Grant Number 16K06318.
Publisher Copyright:
© 2018 IEEE.
PY - 2019/1/7
Y1 - 2019/1/7
N2 - Hum noise activity such as power line noise is one of critical problems in biomedical signals processing. Various approaches utilizing both analog and digital techniques have been proposed. However, these approaches have some disadvantages. This paper proposes the use of N-path notch filter as a hum noise filter. The notch depth in a conventional N-path notch filter is limited by the number of path and off-resistance. A new N-path notch filter with second-order resistor equivalent switched capacitor is proposed. Simulation results show that with resistor equivalent switched capacitor circuit improves the notch depth by 63.67dB with an off-resistance of 200MΩ.
AB - Hum noise activity such as power line noise is one of critical problems in biomedical signals processing. Various approaches utilizing both analog and digital techniques have been proposed. However, these approaches have some disadvantages. This paper proposes the use of N-path notch filter as a hum noise filter. The notch depth in a conventional N-path notch filter is limited by the number of path and off-resistance. A new N-path notch filter with second-order resistor equivalent switched capacitor is proposed. Simulation results show that with resistor equivalent switched capacitor circuit improves the notch depth by 63.67dB with an off-resistance of 200MΩ.
KW - EEG
KW - Hum noise suppression
KW - N-path notch filter
UR - http://www.scopus.com/inward/record.url?scp=85061906749&partnerID=8YFLogxK
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U2 - 10.1109/ISESD.2018.8605468
DO - 10.1109/ISESD.2018.8605468
M3 - Conference contribution
AN - SCOPUS:85061906749
T3 - ISESD 2018 - International Symposium on Electronics and Smart Devices: Smart Devices for Big Data Analytic and Machine Learning
BT - ISESD 2018 - International Symposium on Electronics and Smart Devices
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 International Symposium on Electronics and Smart Devices: Smart Devices for Big Data Analytic and Machine Learning, ISESD 2018
Y2 - 23 October 2018 through 24 October 2018
ER -