Secondary phase particles in bulk, infiltration-growth processed YBCO investigated by transmission Kikuchi diffraction and TEM

研究成果: Article査読

抄録

We present results of the first application of the transmission Kikuchi diffraction (TKD) technique to bulk, infiltration growth (IG)-processed YBa2Cu3O7-δ (YBCO) superconductors with embedded Y2BaCuO5(Y-211) nanoparticles. By means of focused ion-beam (FIB) milling, TEM slices were prepared from mechanically polished surfaces of bulk, IG-processed YBCO samples. The required optical transparency was reached by additional polishing the resulting surfaces using the FIB and Ar-ion milling. For TKD, the sample was mounted on a homebuilt sample holder in the SEM, which provides the required inclination for TKD. The improved spatial resolution of TKD enabled the investigation of the small Y-211 particles (diameter of about 60-210 nm) embedded in the superconducting YBCO matrix. The fabricated TEM slices further enable the application of transmission electron microscopy to the same sample sections. These tiny Y-211 particles embedded within the YBCO matrix are, together with their strain fields, directly responsible for the high irreversibility fields due to the effective flux pinning of the IG-processed samples.

本文言語English
論文番号034010
ジャーナルSuperconductor Science and Technology
33
3
DOI
出版ステータスPublished - 2020 2 12

ASJC Scopus subject areas

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

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