Simulation of buffer-related current slump in AlGaN/GaN HEMTs

Kazushige Horio

研究成果: Conference contribution

抜粋

Transient simulations of AlGaN/GaN HEMTs are performed in which a three-level compensation model is adopted for a semi-insulating buffer-layer, where a shallow donor, a deep donor and a deep acceptor are considered. Quasi-pulsed I-V curves are derived from the transient characteristics, and are compared with steady-state I-V curves. It is shown that so-called current slump is more pronounced when the deep-acceptor density in the buffer layer is higher and when an off-state drain voltage is higher, because trapping effects become more significant. It is suggested that to minimize current slump in AlGaN/GaN HEMTs, an acceptor density in a semi-insulating buffer layer should be made low.

元の言語English
ホスト出版物のタイトル2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings
ページ687-690
ページ数4
出版物ステータスPublished - 2007 8 23
イベント2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007 - Santa Clara, CA, United States
継続期間: 2007 5 202007 5 24

出版物シリーズ

名前2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings
3

Conference

Conference2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007
United States
Santa Clara, CA
期間07/5/2007/5/24

ASJC Scopus subject areas

  • Mechanical Engineering

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  • これを引用

    Horio, K. (2007). Simulation of buffer-related current slump in AlGaN/GaN HEMTs. : 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings (pp. 687-690). (2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings; 巻数 3).