Simulation of reduction properties of radiated emission by on-chip decoupling capacitor

Toshio Sudo, Manabu Bonkohara

研究成果: Conference contribution

2 被引用数 (Scopus)

抄録

This paper reports simulation results on simultaneous switching noise and radiated emission due to the existence of on-chip decoupling capacitor. Signal overshoots/undershoots was observed for the case of on-chip decoupling capacitor, while signal degradation was observed for the case of without on-chip decoupling capacitor. The behavior of ground bounce for the case of on-chip capacitor was different from the case of without on-chip capacitor. The current flow at the power and ground terminals was used as excitation source of FDTD model with the power/ ground plane. The simulation results were compared with the measurement data.

本文言語English
ホスト出版物のタイトルProceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI
ページ15-18
ページ数4
DOI
出版ステータスPublished - 2002 12 1
イベント6th IEEE Workshop on Signal Propagation on Interconnects, SPI - Pisa, Italy
継続期間: 2002 5 122002 5 15

出版物シリーズ

名前Proceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI

Conference

Conference6th IEEE Workshop on Signal Propagation on Interconnects, SPI
国/地域Italy
CityPisa
Period02/5/1202/5/15

ASJC Scopus subject areas

  • 信号処理
  • コンピュータ ネットワークおよび通信

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