抄録
In this study, we have investigated the single crystalline particle formation of InSb and GaSb 111-V type semiconductors by using the drop tube apparatus with a free fall length of 2.5 m. Microstructure and crystal orientation of the fine particle samples prepared by the drop tube process were measured by using SEM-EBSD. The samples were classified into two surface patterns: one is rough, the other is smooth. The sample with rough surface showed a polycrystalline structure, while the sample with smooth surface showed a single crystal formation.
本文言語 | English |
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ページ(範囲) | 419-421 |
ページ数 | 3 |
ジャーナル | Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals |
巻 | 79 |
号 | 8 |
DOI | |
出版ステータス | Published - 2015 8月 1 |
ASJC Scopus subject areas
- 凝縮系物理学
- 材料力学
- 金属および合金
- 材料化学