Small Signal Characteristics of n+Ge Gate AlGaAs/GaAs MISFETs

Shiuichi Fujita, Makoto Hirano, Koichi Maezawa, Takashi Mizutani

研究成果: Article › 査読

本文言語	English
ページ（範囲）	518-520
ジャーナル	IEEE Electron Device Letters
巻	EDL-9
出版ステータス	Published - 1988 4月 1

引用スタイル

@article{85174d629a41466d882d3ad3059733bf,

title = "Small Signal Characteristics of n+Ge Gate AlGaAs/GaAs MISFETs",

author = "Shiuichi Fujita and Makoto Hirano and Koichi Maezawa and Takashi Mizutani",

year = "1988",

month = apr,

day = "1",

language = "English",

volume = "EDL-9",

pages = "518--520",

journal = "IEEE Electron Device Letters",

issn = "0741-3106",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}