Spectroscopic ellipsometry study on TiO 2 thin films modified by N 2 -H 2 plasma surface treatment

S. Tanemura, L. Miao, H. Watanabe, Y. Mori

研究成果: Conference article査読

6 被引用数 (Scopus)

抄録

We analyzed successfully the refractive index, n, and extinction coefficient, k, of three samples such as as-deposited single-phase anatase-TiO 2 polycrystalline thin films on slide glass substrates (#1), the sample surface-treated by N 2 -H 2 mixed-gases plasma (#2), and the sample being additionally anneal-treated in N 2 gases (#3), by spectroscopic ellipsometry (SE). The double-layered film configuration named as the surface and the bulk layers is employed in SE analysis. The optical properties of the surface layer are confirmed to be important to explain the significant red shift of the absorption edge of both surface-treated samples observed in the preceding report. Particularly, the obtained imaginary part of complex dielectric constant of the surface layer of the samples #2 and #3 shows significant difference from that of the sample #1. This is due to the absorptive transitions not by solely anatase-TiO 2 but by mixed formation of TiO 2-x N x and TiN with metallic characteristics.

本文言語English
ページ(範囲)546-549
ページ数4
ジャーナルApplied Surface Science
244
1-4
DOI
出版ステータスPublished - 2005 5月 15
外部発表はい
イベント12th International Conference on Solid Films and Surfaces - Hammatsu, Japan
継続期間: 2004 6月 212004 6月 25

ASJC Scopus subject areas

  • 化学 (全般)
  • 凝縮系物理学
  • 物理学および天文学(全般)
  • 表面および界面
  • 表面、皮膜および薄膜

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