TY - JOUR
T1 - Stripe and criss-cross patterns in high-Tc superconductors revealed by atomic force microscopy and scanning tunnelling microscopy
AU - Koblischka, Michael R.
AU - Winter, Marc
AU - Hu, Anming
AU - Murakami, Masato
AU - Hartmann, Uwe
PY - 2006/3/27
Y1 - 2006/3/27
N2 - By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa2Cu3Ox (YBCO), SmBa2Cu3Ox- (SmBCO), and (Sm,Eu,Gd)Ba 2Cu3Ox (SEG) oxidic high-Tc superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.
AB - By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa2Cu3Ox (YBCO), SmBa2Cu3Ox- (SmBCO), and (Sm,Eu,Gd)Ba 2Cu3Ox (SEG) oxidic high-Tc superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.
KW - AFM
KW - Aging
KW - Composition modulation
KW - High-T superconductors
KW - Nanostripes
KW - Oxides
KW - STM
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U2 - 10.1143/JJAP.45.2259
DO - 10.1143/JJAP.45.2259
M3 - Article
AN - SCOPUS:33645516626
VL - 45
SP - 2259
EP - 2263
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 3 B
ER -