Stripe and criss-cross patterns in high-Tc superconductors revealed by atomic force microscopy and scanning tunnelling microscopy

Michael R. Koblischka; Marc Winter; Anming Hu; Masato Murakami; Uwe Hartmann

doi:10.1143/JJAP.45.2259

Stripe and criss-cross patterns in high-T_c superconductors revealed by atomic force microscopy and scanning tunnelling microscopy

Michael R. Koblischka, Marc Winter, Anming Hu, Masato Murakami, Uwe Hartmann

研究成果: Article › 査読

13 被引用数 (Scopus)

抄録

By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa₂Cu₃O_x (YBCO), SmBa₂Cu₃O_x- (SmBCO), and (Sm,Eu,Gd)Ba ₂Cu₃O_x (SEG) oxidic high-T_c superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.

本文言語	English
ページ（範囲）	2259-2263
ページ数	5
ジャーナル	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
巻	45
号	3 B
DOI	https://doi.org/10.1143/JJAP.45.2259
出版ステータス	Published - 2006 3月 27
外部発表	はい

ASJC Scopus subject areas

工学（全般）
物理学および天文学（全般）

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10.1143/JJAP.45.2259

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引用スタイル

Stripe and criss-cross patterns in high-T_c superconductors revealed by atomic force microscopy and scanning tunnelling microscopy. / Koblischka, Michael R.; Winter, Marc; Hu, Anming; Murakami, Masato; Hartmann, Uwe.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 45, No. 3 B, 27.03.2006, p. 2259-2263.

研究成果: Article › 査読

@article{47cda8efcdf74633bee946eb6d7fbd52,

title = "Stripe and criss-cross patterns in high-Tc superconductors revealed by atomic force microscopy and scanning tunnelling microscopy",

abstract = "By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa2Cu3Ox (YBCO), SmBa2Cu3Ox- (SmBCO), and (Sm,Eu,Gd)Ba 2Cu3Ox (SEG) oxidic high-Tc superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.",

keywords = "AFM, Aging, Composition modulation, High-T superconductors, Nanostripes, Oxides, STM",

author = "Koblischka, {Michael R.} and Marc Winter and Anming Hu and Masato Murakami and Uwe Hartmann",

year = "2006",

month = mar,

day = "27",

doi = "10.1143/JJAP.45.2259",

language = "English",

volume = "45",

pages = "2259--2263",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "3 B",

}

TY - JOUR

T1 - Stripe and criss-cross patterns in high-Tc superconductors revealed by atomic force microscopy and scanning tunnelling microscopy

AU - Koblischka, Michael R.

AU - Winter, Marc

AU - Hu, Anming

AU - Murakami, Masato

AU - Hartmann, Uwe

PY - 2006/3/27

Y1 - 2006/3/27

N2 - By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa2Cu3Ox (YBCO), SmBa2Cu3Ox- (SmBCO), and (Sm,Eu,Gd)Ba 2Cu3Ox (SEG) oxidic high-Tc superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.

AB - By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa2Cu3Ox (YBCO), SmBa2Cu3Ox- (SmBCO), and (Sm,Eu,Gd)Ba 2Cu3Ox (SEG) oxidic high-Tc superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.

KW - AFM

KW - Aging

KW - Composition modulation

KW - High-T superconductors

KW - Nanostripes

KW - Oxides

KW - STM

UR - http://www.scopus.com/inward/record.url?scp=33645516626&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33645516626&partnerID=8YFLogxK

U2 - 10.1143/JJAP.45.2259

DO - 10.1143/JJAP.45.2259

M3 - Article

AN - SCOPUS:33645516626

VL - 45

SP - 2259

EP - 2263

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 3 B

ER -