Stripe and criss-cross patterns in high-Tc superconductors revealed by atomic force microscopy and scanning tunnelling microscopy

Michael R. Koblischka, Marc Winter, Anming Hu, Masato Murakami, Uwe Hartmann

研究成果: Article査読

13 被引用数 (Scopus)

抄録

By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa2Cu3Ox (YBCO), SmBa2Cu3Ox- (SmBCO), and (Sm,Eu,Gd)Ba 2Cu3Ox (SEG) oxidic high-Tc superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.

本文言語English
ページ(範囲)2259-2263
ページ数5
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
45
3 B
DOI
出版ステータスPublished - 2006 3 27

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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