Structural characterization of shock-affected sapphire

M. Mazilu, S. Juodkazis, T. Ebisui, S. Matsuo, H. Misawa

研究成果: Article

24 引用 (Scopus)

抜粋

The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 μm depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of e∼ 8×1012 cm-2.

元の言語English
ページ(範囲)197-200
ページ数4
ジャーナルApplied Physics A: Materials Science and Processing
86
発行部数2
DOI
出版物ステータスPublished - 2007 2 1
外部発表Yes

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)

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