Structural characterization of shock-affected sapphire

M. Mazilu, S. Juodkazis, T. Ebisui, S. Matsuo, H. Misawa

研究成果査読

25 被引用数 (Scopus)

抄録

The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 μm depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of e∼ 8×1012 cm-2.

本文言語English
ページ(範囲)197-200
ページ数4
ジャーナルApplied Physics A: Materials Science and Processing
86
2
DOI
出版ステータスPublished - 2007 2
外部発表はい

ASJC Scopus subject areas

  • 化学 (全般)
  • 材料科学(全般)

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