Study of cross-sections of magnetite thin films by means of electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, F. Mücklich, U. Hartmann

研究成果: Article査読

1 被引用数 (Scopus)

抄録

By means of electron backscatter diffraction (EBSD), we studied the grain orientation of cross-sections of magnetite (Fe 3O 4) thin films grown on (001) oriented MgO substrates. Earlier studies showed that the magnetic properties of the magnetite films are dominated by the presence of so-called anti-phase boundaries (APBs). The use of cross-sections of thin-films enables to study the growth mechanism in a more direct way. The EBSD maps reveal that the first magnetite layer on the MgO substrate is comprised of many small, misoriented magnetite grains. Subsequent layers show the desired (001) orientation with a ±5° misorientation. The misorientations found in the cross-section of the film resemble those obtained in EBSD measurements at the sample surface.

本文言語English
ページ(範囲)1835-1838
ページ数4
ジャーナルPhysica Status Solidi (A) Applications and Materials Science
205
8
DOI
出版ステータスPublished - 2008 8 1
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 表面および界面
  • 表面、皮膜および薄膜
  • 電子工学および電気工学
  • 材料化学

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