Sub-picosecond optical damaging of silica: Time resolved measurements of light induced damage threshold

S. Juodkazis, A. Marcinkevičius, M. Watanabe, V. Mizeikis, Shigeki Matsuo, H. Misawa

研究成果: Conference contribution

9 引用 (Scopus)

抄録

We investigate damage of purified silica (transmission band down to 160 nm) by sub-ps light pulses having a wave-length of 795 nm. Illumination by 350 fs duration pulses focused by a high numerical aperture NA = 1.35 microscope objective results in one of the lowest reported values for the single-shot bulk light-induced damage threshold (LIDT) of 5 J/cm 2, well below the critical self-focusing power in silica. We have also investigated peculiarities of damage by two coincident laser pulses (duration 440 fs) having power of about 0.5 × LIDT, and linearly cross-polarized to avoid interference effects. The reduction of LIDT in silica is demonstrated for an elevated lattice temperature T=400 K, at which the thermal linear/volume expansion coefficient has its maximum. Comparison between the LIDT values obtained from the numeric simulation and experiments demonstrates, that the critical density of optically generated free carriers corresponding to LIDT n cr≃10 21 cm -3 is reached during the first half time of the laser pulse illumination(0.2 ps).

元の言語English
ホスト出版物のタイトルProceedings of SPIE - The International Society for Optical Engineering
編集者G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis, M.J. Soileau
ページ212-222
ページ数11
4347
DOI
出版物ステータスPublished - 2001
外部発表Yes
イベント32nd Annual Boulder Damage Symposium - Laser-Induced Damaged in Optical Materials: 2000 - Boulder, CO, United States
継続期間: 2000 10 162000 10 18

Other

Other32nd Annual Boulder Damage Symposium - Laser-Induced Damaged in Optical Materials: 2000
United States
Boulder, CO
期間00/10/1600/10/18

Fingerprint

yield point
Time measurement
Silica
time measurement
silicon dioxide
Laser pulses
pulse duration
Lighting
illumination
damage
Wave interference
self focusing
numerical aperture
pulses
shot
lasers
Microscopes
microscopes
interference
Wavelength

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

これを引用

Juodkazis, S., Marcinkevičius, A., Watanabe, M., Mizeikis, V., Matsuo, S., & Misawa, H. (2001). Sub-picosecond optical damaging of silica: Time resolved measurements of light induced damage threshold. : G. J. Exarhos, A. H. Guenther, M. R. Kozlowski, K. L. Lewis, & M. J. Soileau (版), Proceedings of SPIE - The International Society for Optical Engineering (巻 4347, pp. 212-222) https://doi.org/10.1117/12.425013

Sub-picosecond optical damaging of silica : Time resolved measurements of light induced damage threshold. / Juodkazis, S.; Marcinkevičius, A.; Watanabe, M.; Mizeikis, V.; Matsuo, Shigeki; Misawa, H.

Proceedings of SPIE - The International Society for Optical Engineering. 版 / G.J. Exarhos; A.H. Guenther; M.R. Kozlowski; K.L. Lewis; M.J. Soileau. 巻 4347 2001. p. 212-222.

研究成果: Conference contribution

Juodkazis, S, Marcinkevičius, A, Watanabe, M, Mizeikis, V, Matsuo, S & Misawa, H 2001, Sub-picosecond optical damaging of silica: Time resolved measurements of light induced damage threshold. : GJ Exarhos, AH Guenther, MR Kozlowski, KL Lewis & MJ Soileau (版), Proceedings of SPIE - The International Society for Optical Engineering. 巻. 4347, pp. 212-222, 32nd Annual Boulder Damage Symposium - Laser-Induced Damaged in Optical Materials: 2000, Boulder, CO, United States, 00/10/16. https://doi.org/10.1117/12.425013
Juodkazis S, Marcinkevičius A, Watanabe M, Mizeikis V, Matsuo S, Misawa H. Sub-picosecond optical damaging of silica: Time resolved measurements of light induced damage threshold. : Exarhos GJ, Guenther AH, Kozlowski MR, Lewis KL, Soileau MJ, 編集者, Proceedings of SPIE - The International Society for Optical Engineering. 巻 4347. 2001. p. 212-222 https://doi.org/10.1117/12.425013
Juodkazis, S. ; Marcinkevičius, A. ; Watanabe, M. ; Mizeikis, V. ; Matsuo, Shigeki ; Misawa, H. / Sub-picosecond optical damaging of silica : Time resolved measurements of light induced damage threshold. Proceedings of SPIE - The International Society for Optical Engineering. 編集者 / G.J. Exarhos ; A.H. Guenther ; M.R. Kozlowski ; K.L. Lewis ; M.J. Soileau. 巻 4347 2001. pp. 212-222
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