Sub-picosecond optical damaging of silica: Time resolved measurements of light induced damage threshold

S. Juodkazis, A. Marcinkevičius, M. Watanabe, V. Mizeikis, S. Matsuo, H. Misawa

研究成果: Conference article査読

9 被引用数 (Scopus)


We investigate damage of purified silica (transmission band down to 160 nm) by sub-ps light pulses having a wave-length of 795 nm. Illumination by 350 fs duration pulses focused by a high numerical aperture NA = 1.35 microscope objective results in one of the lowest reported values for the single-shot bulk light-induced damage threshold (LIDT) of 5 J/cm2, well below the critical self-focusing power in silica. We have also investigated peculiarities of damage by two coincident laser pulses (duration 440 fs) having power of about 0.5 × LIDT, and linearly cross-polarized to avoid interference effects. The reduction of LIDT in silica is demonstrated for an elevated lattice temperature T=400 K, at which the thermal linear/volume expansion coefficient has its maximum. Comparison between the LIDT values obtained from the numeric simulation and experiments demonstrates, that the critical density of optically generated free carriers corresponding to LIDT ncr≃1021 cm-3 is reached during the first half time of the laser pulse illumination(0.2 ps).

ジャーナルProceedings of SPIE - The International Society for Optical Engineering
出版ステータスPublished - 2001
イベント32nd Annual Boulder Damage Symposium - Laser-Induced Damaged in Optical Materials: 2000 - Boulder, CO, United States
継続期間: 2000 10月 162000 10月 18

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学


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