TEM and electron backscatter diffraction analysis (EBSD) on superconducting nanowires

A. Koblischka-Veneva, M. R. Koblischka, X. L. Zeng, J. Schmauch, U. Hartmann

研究成果: Conference article査読

11 被引用数 (Scopus)

抄録

Electrospun, superconducting nanowires are characterized concerning the grain orientation, their texture and the respective grain boundary misorientations by means of electron backscatter diffraction (EBSD) analysis. The individual nanowires in such electrospun, nonwoven nanowire networks of Bi2Sr2CaCu2O x (Bi-2212) are polycrystalline, have average diameters up to 250 nm and their grains are in the 20-50 nm range. This requires a high spatial resolution for the analysis in the scanning electron microscope. However, the small diameter of the nanowires enables the application of the newly developed transmission EBSD (t-EBSD) technique without the preparation of TEM slices. Here, we present TEM images of individual nanowires and several EBSD mappings on Bi-2212 nanowires and compare their microstructure to those of filaments of the first generation tapes.

本文言語English
論文番号012005
ジャーナルJournal of Physics: Conference Series
1054
1
DOI
出版ステータスPublished - 2018 7 26
外部発表はい
イベント30th International Symposium on Superconductivity, ISS 2017 - Tokyo, Japan
継続期間: 2017 12 132017 12 15

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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