抄録
We have conducted transmission electron microscopic observations along the [001] direction of the interfaces between Y2BaCuO5inclusions and the YBa2Cu3O7matrix in the YBaCuO crystals fabricated by the Melt-Powder-Melt-Growth process. Amorphous layers about 1 nm in thickness are observed at some interfaces. We could not find observable crystallographic defects at the interfaces.
本文言語 | English |
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ページ(範囲) | L1428-L1431 |
ジャーナル | Japanese Journal of Applied Physics |
巻 | 29 |
号 | 8 |
DOI | |
出版ステータス | Published - 1990 8月 |
外部発表 | はい |
ASJC Scopus subject areas
- 工学(全般)
- 物理学および天文学(全般)