Texture analysis of melt-spun Ni-Mn-Ga tapes by means of electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, J. Schmauch, A. Mitra, A. K. Panda

研究成果: Conference article査読

5 被引用数 (Scopus)

抄録

A texture analysis is performed by means of the electron-backscatter diffraction technique (EBSD) on melt-spun ribbon-like samples of the composition Ni52.5Mn24.5Ga23 (at.-%) were prepared. A dedicated surface treatment is required in order to achieve high quality Kikuchi patterns. For this purpose, mechanical polishing plus ion polishing was employed. EBSD analysis and transmission electron microscopy revealed that the samples have a polycrystalline, granular morphology, with grain sizes around 1 - 2 μm. Several larger grains being present in the region selected for EBSD analysis, and many small grains are found, even embedded in the larger ones. The larger grains exhibit a common direction of elongation, yielding to a specific texture.

本文言語English
論文番号082013
ジャーナルJournal of Physics: Conference Series
200
SECTION 8
DOI
出版ステータスPublished - 2010
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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