Texture analysis of melt-spun Ni-Mn-Ga tapes by means of electron backscatter diffraction (EBSD)

研究成果: Conference article

5 引用 (Scopus)

抄録

A texture analysis is performed by means of the electron-backscatter diffraction technique (EBSD) on melt-spun ribbon-like samples of the composition Ni52.5Mn24.5Ga23 (at.-%) were prepared. A dedicated surface treatment is required in order to achieve high quality Kikuchi patterns. For this purpose, mechanical polishing plus ion polishing was employed. EBSD analysis and transmission electron microscopy revealed that the samples have a polycrystalline, granular morphology, with grain sizes around 1 - 2 μm. Several larger grains being present in the region selected for EBSD analysis, and many small grains are found, even embedded in the larger ones. The larger grains exhibit a common direction of elongation, yielding to a specific texture.

元の言語English
記事番号082013
ジャーナルJournal of Physics: Conference Series
200
発行部数SECTION 8
DOI
出版物ステータスPublished - 2010 1 1
外部発表Yes

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tapes
textures
polishing
diffraction
electrons
surface treatment
ribbons
elongation
grain size
transmission electron microscopy
ions

ASJC Scopus subject areas

  • Physics and Astronomy(all)

これを引用

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title = "Texture analysis of melt-spun Ni-Mn-Ga tapes by means of electron backscatter diffraction (EBSD)",
abstract = "A texture analysis is performed by means of the electron-backscatter diffraction technique (EBSD) on melt-spun ribbon-like samples of the composition Ni52.5Mn24.5Ga23 (at.-{\%}) were prepared. A dedicated surface treatment is required in order to achieve high quality Kikuchi patterns. For this purpose, mechanical polishing plus ion polishing was employed. EBSD analysis and transmission electron microscopy revealed that the samples have a polycrystalline, granular morphology, with grain sizes around 1 - 2 μm. Several larger grains being present in the region selected for EBSD analysis, and many small grains are found, even embedded in the larger ones. The larger grains exhibit a common direction of elongation, yielding to a specific texture.",
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T1 - Texture analysis of melt-spun Ni-Mn-Ga tapes by means of electron backscatter diffraction (EBSD)

AU - Koblischka-Veneva, Anjela Dimitrova

AU - Koblischka, Michael Rudolf

AU - Schmauch, J.

AU - Mitra, A.

AU - Panda, A. K.

PY - 2010/1/1

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N2 - A texture analysis is performed by means of the electron-backscatter diffraction technique (EBSD) on melt-spun ribbon-like samples of the composition Ni52.5Mn24.5Ga23 (at.-%) were prepared. A dedicated surface treatment is required in order to achieve high quality Kikuchi patterns. For this purpose, mechanical polishing plus ion polishing was employed. EBSD analysis and transmission electron microscopy revealed that the samples have a polycrystalline, granular morphology, with grain sizes around 1 - 2 μm. Several larger grains being present in the region selected for EBSD analysis, and many small grains are found, even embedded in the larger ones. The larger grains exhibit a common direction of elongation, yielding to a specific texture.

AB - A texture analysis is performed by means of the electron-backscatter diffraction technique (EBSD) on melt-spun ribbon-like samples of the composition Ni52.5Mn24.5Ga23 (at.-%) were prepared. A dedicated surface treatment is required in order to achieve high quality Kikuchi patterns. For this purpose, mechanical polishing plus ion polishing was employed. EBSD analysis and transmission electron microscopy revealed that the samples have a polycrystalline, granular morphology, with grain sizes around 1 - 2 μm. Several larger grains being present in the region selected for EBSD analysis, and many small grains are found, even embedded in the larger ones. The larger grains exhibit a common direction of elongation, yielding to a specific texture.

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