Texture analysis of melt-spun Ni-Mn-Ga tapes by means of electron backscatter diffraction (EBSD)
A. Koblischka-Veneva, M. R. Koblischka, J. Schmauch, A. Mitra, A. K. Panda
研究成果: Conference article › 査読
5
被引用数
(Scopus)