Texture analysis of monofilamentary, Ag-sheathed (Pb,Bi)2Sr2Ca2Cu3O x tapes by electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, T. Qu, Z. Han, F. Mücklich

研究成果: Article査読

8 被引用数 (Scopus)

抄録

Using automated orientation imaging, the grain orientations and texture of monofilamentary, Ag-sheathed (Pb,Bi)2Sr2Ca2Cu3O x (Bi-2223) tape is analysed in detail by means of electron backscatter diffraction (EBSD). The achieved high image quality of the Kikuchi patterns enables multi-phase scans including Bi-2223, Bi2Sr2CaCu2Ox, Bi2Sr2CuOx, (Sr,Ca)14Cu24O41 and Ag to be performed. Two areas are selected for the EBSD analysis, one close to the silver sheath, the other located in the center of the sample. The grain orientation maps are presented for each phase separately allowing a new insight into the microtexture of Ag-sheathed Bi-2223 tapes. Furthermore, the EBSD analysis provides the possibility for a misorientation angle analysis within each individual phase.

本文言語English
ページ(範囲)174-182
ページ数9
ジャーナルPhysica C: Superconductivity and its applications
468
3
DOI
出版ステータスPublished - 2008 2月 1
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • エネルギー工学および電力技術
  • 電子工学および電気工学

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