The number of sub-pixel defects that is acceptable for various panel size and pixel sizes

Yuzo Hisatake, Tatsuya Miyazaki, Ryoji Yoshitake, Yoshihiko Nakano

研究成果: Conference contribution

2 引用 (Scopus)

抄録

User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.

元の言語English
ホスト出版物のタイトルDigest of Technical Papers - SID International Symposium
ページ390-393
ページ数4
36
エディション1
DOI
出版物ステータスPublished - 2005
外部発表Yes
イベントSID Symposium Digest of Technical Papers - Boston, MA, United States
継続期間: 2004 7 292004 7 29

Other

OtherSID Symposium Digest of Technical Papers
United States
Boston, MA
期間04/7/2904/7/29

Fingerprint

Pixels
Defects

ASJC Scopus subject areas

  • Engineering(all)

これを引用

Hisatake, Y., Miyazaki, T., Yoshitake, R., & Nakano, Y. (2005). The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. : Digest of Technical Papers - SID International Symposium (1 版, 巻 36, pp. 390-393). [P-178] https://doi.org/10.1889/1.2036454

The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. / Hisatake, Yuzo; Miyazaki, Tatsuya; Yoshitake, Ryoji; Nakano, Yoshihiko.

Digest of Technical Papers - SID International Symposium. 巻 36 1. 編 2005. p. 390-393 P-178.

研究成果: Conference contribution

Hisatake, Y, Miyazaki, T, Yoshitake, R & Nakano, Y 2005, The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. : Digest of Technical Papers - SID International Symposium. 1 Edn, 巻. 36, P-178, pp. 390-393, SID Symposium Digest of Technical Papers, Boston, MA, United States, 04/7/29. https://doi.org/10.1889/1.2036454
Hisatake Y, Miyazaki T, Yoshitake R, Nakano Y. The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. : Digest of Technical Papers - SID International Symposium. 1 版 巻 36. 2005. p. 390-393. P-178 https://doi.org/10.1889/1.2036454
Hisatake, Yuzo ; Miyazaki, Tatsuya ; Yoshitake, Ryoji ; Nakano, Yoshihiko. / The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. Digest of Technical Papers - SID International Symposium. 巻 36 1. 版 2005. pp. 390-393
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