Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope

A. Hashimoto; P. Wang; M. Shimojo; K. Mitsuishi; A. I. Kirkl; P. D. Nellist; M. Takeguchi

Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope

A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, A. I. Kirkl, P. D. Nellist, M. Takeguchi

機能制御システム専攻

研究成果: Article › 査読

本文言語	English
ジャーナル	Default journal
出版ステータス	Published - 2010 6月 1

引用スタイル

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title = "Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope",

author = "A. Hashimoto and P. Wang and M. Shimojo and K. Mitsuishi and Kirkl, {A. I.} and Nellist, {P. D.} and M. Takeguchi",

year = "2010",

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T1 - Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope

AU - Hashimoto, A.

AU - Wang, P.

AU - Shimojo, M.

AU - Mitsuishi, K.

AU - Kirkl, A. I.

AU - Nellist, P. D.

AU - Takeguchi, M.

PY - 2010/6/1

Y1 - 2010/6/1

M3 - Article

JO - Default journal

JF - Default journal

ER -