抄録
We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution was independent of the lateral size. Furthermore, the nanoparticle elongation length was reduced to 34 nm as compared with that by an uncorrected microscope. Hence, aberration-corrected ADF-SCEM provides structural information not only on the nanoparticles but also on the large carbon supports such as projecting nanohorns and hollow structures. Finally, aberration-corrected ADF-SCEM is effective for the 3D analysis of nanoparticle-supported composites.
| 元の言語 | English |
|---|---|
| 記事番号 | 253108 |
| ジャーナル | Applied Physics Letters |
| 巻 | 101 |
| 発行部数 | 25 |
| DOI | |
| 出版物ステータス | Published - 2012 12 17 |
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ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
これを引用
Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy. / Hashimoto, Ayako; Wang, Peng; Shimojo, Masayuki; Mitsuishi, Kazutaka; Nellist, Peter D.; Kirkland, Angus I.; Takeguchi, Masaki.
：: Applied Physics Letters, 巻 101, 番号 25, 253108, 17.12.2012.研究成果: Article
}
TY - JOUR
T1 - Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy
AU - Hashimoto, Ayako
AU - Wang, Peng
AU - Shimojo, Masayuki
AU - Mitsuishi, Kazutaka
AU - Nellist, Peter D.
AU - Kirkland, Angus I.
AU - Takeguchi, Masaki
PY - 2012/12/17
Y1 - 2012/12/17
N2 - We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution was independent of the lateral size. Furthermore, the nanoparticle elongation length was reduced to 34 nm as compared with that by an uncorrected microscope. Hence, aberration-corrected ADF-SCEM provides structural information not only on the nanoparticles but also on the large carbon supports such as projecting nanohorns and hollow structures. Finally, aberration-corrected ADF-SCEM is effective for the 3D analysis of nanoparticle-supported composites.
AB - We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution was independent of the lateral size. Furthermore, the nanoparticle elongation length was reduced to 34 nm as compared with that by an uncorrected microscope. Hence, aberration-corrected ADF-SCEM provides structural information not only on the nanoparticles but also on the large carbon supports such as projecting nanohorns and hollow structures. Finally, aberration-corrected ADF-SCEM is effective for the 3D analysis of nanoparticle-supported composites.
UR - http://www.scopus.com/inward/record.url?scp=84871738499&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84871738499&partnerID=8YFLogxK
U2 - 10.1063/1.4772514
DO - 10.1063/1.4772514
M3 - Article
AN - SCOPUS:84871738499
VL - 101
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 25
M1 - 253108
ER -