Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy

Ayako Hashimoto; Peng Wang; Masayuki Shimojo; Kazutaka Mitsuishi; Peter D. Nellist; Angus I. Kirkland; Masaki Takeguchi

doi:10.1063/1.4772514

Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy

Ayako Hashimoto, Peng Wang, Masayuki Shimojo, Kazutaka Mitsuishi, Peter D. Nellist, Angus I. Kirkland, Masaki Takeguchi

研究成果: Article

8 引用（Scopus）

抜粋

We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution was independent of the lateral size. Furthermore, the nanoparticle elongation length was reduced to 34 nm as compared with that by an uncorrected microscope. Hence, aberration-corrected ADF-SCEM provides structural information not only on the nanoparticles but also on the large carbon supports such as projecting nanohorns and hollow structures. Finally, aberration-corrected ADF-SCEM is effective for the 3D analysis of nanoparticle-supported composites.

元の言語	English
記事番号	253108
ジャーナル	Applied Physics Letters
巻	101
発行部数	25
DOI	https://doi.org/10.1063/1.4772514
出版物ステータス	Published - 2012 12 17

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

文献にアクセス

10.1063/1.4772514

フィンガープリント Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

これを引用

Hashimoto, A., Wang, P., Shimojo, M., Mitsuishi, K., Nellist, P. D., Kirkland, A. I., & Takeguchi, M. (2012). Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy. Applied Physics Letters, 101(25), [253108]. https://doi.org/10.1063/1.4772514

@article{f09a50908cb14bd6a45302ddc00f4717,

title = "Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy",

abstract = "We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution was independent of the lateral size. Furthermore, the nanoparticle elongation length was reduced to 34 nm as compared with that by an uncorrected microscope. Hence, aberration-corrected ADF-SCEM provides structural information not only on the nanoparticles but also on the large carbon supports such as projecting nanohorns and hollow structures. Finally, aberration-corrected ADF-SCEM is effective for the 3D analysis of nanoparticle-supported composites.",

author = "Ayako Hashimoto and Peng Wang and Masayuki Shimojo and Kazutaka Mitsuishi and Nellist, {Peter D.} and Kirkland, {Angus I.} and Masaki Takeguchi",

year = "2012",

month = dec,

day = "17",

doi = "10.1063/1.4772514",

language = "English",

volume = "101",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "25",

}

TY - JOUR

T1 - Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy

AU - Hashimoto, Ayako

AU - Wang, Peng

AU - Shimojo, Masayuki

AU - Mitsuishi, Kazutaka

AU - Nellist, Peter D.

AU - Kirkland, Angus I.

AU - Takeguchi, Masaki

PY - 2012/12/17

Y1 - 2012/12/17

N2 - We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution was independent of the lateral size. Furthermore, the nanoparticle elongation length was reduced to 34 nm as compared with that by an uncorrected microscope. Hence, aberration-corrected ADF-SCEM provides structural information not only on the nanoparticles but also on the large carbon supports such as projecting nanohorns and hollow structures. Finally, aberration-corrected ADF-SCEM is effective for the 3D analysis of nanoparticle-supported composites.

AB - We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution was independent of the lateral size. Furthermore, the nanoparticle elongation length was reduced to 34 nm as compared with that by an uncorrected microscope. Hence, aberration-corrected ADF-SCEM provides structural information not only on the nanoparticles but also on the large carbon supports such as projecting nanohorns and hollow structures. Finally, aberration-corrected ADF-SCEM is effective for the 3D analysis of nanoparticle-supported composites.

UR - http://www.scopus.com/inward/record.url?scp=84871738499&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84871738499&partnerID=8YFLogxK

U2 - 10.1063/1.4772514

DO - 10.1063/1.4772514

M3 - Article

AN - SCOPUS:84871738499

VL - 101

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 25

M1 - 253108

ER -