Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy

X. Zhang, X. Zhang;M.Takeguchi;A.Hashimoto;K.Mitsuishi;P.Wang;P Kirkl, ;M. Tezuka;M. Shimojo

研究成果: Article

6 引用 (Scopus)
元の言語English
ページ(範囲)159-169
ジャーナルJ. Electron Microsc.
61
出版物ステータスPublished - 2012 12 1

これを引用

Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy. / Zhang, X.; Kirkl, X. Zhang;M.Takeguchi;A.Hashimoto;K.Mitsuishi;P.Wang;P; Shimojo, ;M. Tezuka;M.

:: J. Electron Microsc., 巻 61, 01.12.2012, p. 159-169.

研究成果: Article

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AU - Shimojo, ;M. Tezuka;M.

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