Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

P. D. Nellist, P. Wang, G. Behan, A. I. Kirkl, A. Hashimoto, M. Shimojo, K. Mitsuishi, M. Takeguchi, E. C. Cosgriff, A. J. D'Alfonso, L. J. Allen, S. J. Findlay

研究成果: Article

元の言語English
ジャーナルDefault journal
出版物ステータスPublished - 2010 8 1

これを引用

Nellist, P. D., Wang, P., Behan, G., Kirkl, A. I., Hashimoto, A., Shimojo, M., Mitsuishi, K., Takeguchi, M., Cosgriff, E. C., D'Alfonso, A. J., Allen, L. J., & Findlay, S. J. (2010). Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy. Default journal.