A novel two-beam X-ray interferometer using two multiple Bragg-Laue (MBL) mode interferometers has been developed. The first MBL interferometer was utilized not only as a monochromator to generate a highly coherent beam but also as a beam splitter. The second MBL interferometer was used as an analyzer. By using this two-beam X-ray interferometer, interference fringes were observed as a function of the thickness of a phase plate inserted in one path of incident X-rays. The visibility of the measured fringes is approximately 25%. Some advantages of this MBL interferometer are pointed out.
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