Two-dimensional analysis of slow current transients and current collapse in GaN FETs with a semi-insulating buffer layer

K.Horio K.Horio, H.Takayanagi H.Takayanagi, H.Nakano H.Nakano, K.Yonemoto K.Yonemoto, Kazushige Horio

研究成果: Article

元の言語English
ページ(範囲)1-9
ジャーナルShibaura Institute of Technology
50
出版物ステータスPublished - 2006 9 30

これを引用

K.Horio, K. H., H.Takayanagi, H. T., H.Nakano, H. N., K.Yonemoto, K. Y., & Horio, K. (2006). Two-dimensional analysis of slow current transients and current collapse in GaN FETs with a semi-insulating buffer layer. Shibaura Institute of Technology, 50, 1-9.