Two-Dimensional Simulations of Drain-Current Transients in GaAs MESFET’s with Semi-insulating Substrates Compensated by Deep Levels

Kazushige Horio

研究成果: Article査読

40 被引用数 (Scopus)

抄録

Drain-current transients of GaAs MESFET’s with deep donors “EL2" in the semi-insulating substrate are simulated in the range t = 10-13 to 102 s. It is shown that in the drain step responses, there exists a “quasi-steady state" where the deep donors do not respond to the voltage change and the drain currents become constant temporarily. The drain currents begin to decrease or increase gradually when the deep donors begin to capture or emit electrons, reaching real steady-state values. I-V curves are quite different between the “quasi-steady state" and the steady state. Therefore, the deep donors in the semi-insulating substrate can be causes of drain-current drifts and hysteresis in I-V curves. Effects of introducing a p-buffer layer are also studied. It is concluded that the use of a low acceptor density semi-insulating substrate combined with introducing a p-buffer layer is effective to minimize the unfavorable phenomena and to utilize high performances of GaAs MESFET’s.

本文言語English
ページ(範囲)1340-1346
ページ数7
ジャーナルIEEE Transactions on Electron Devices
41
8
DOI
出版ステータスPublished - 1994 8

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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